Test data compression for any quantum Boolean circuits

In this paper, a novel test data compression method for quantum Boolean circuits is proposed. By using Hadamard transformation as a decompressor for input vectors and as a time compactor for output responses, we can always detect the fault no matter where it occurs at the circuit under test. Following that, a zero-controlled-not gate can be applied as a space compactor. As a result, not only can the stimulus on the input side be significantly compressed to only one test pattern but also the response on the output side can be drastically compacted to one single bit.