DocumentCode
511577
Title
Analysis of keratinocytes stiffness after desmosome disruption using Atomic Force Microscopy based nanomanipulation
Author
Yang, Ruiguo ; Xi, Ning ; Kar, Carmen ; Fung, Man ; Wai, King ; Lai, Chiu ; Seiffert-Sinha, Kristian ; Sinha, Amnish A.
Author_Institution
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear
2009
fDate
26-30 July 2009
Firstpage
640
Lastpage
643
Abstract
Desmosomes are cell-cell junctions that provide mechanical strength for cells and maintain integrity of tissues in animal skins and hearts. Disruption of the desmosome like in some autoimmune diseases will therefore change the mechanical property of the anchoring cells and causing blistering. In the paper, we used Atomic Force Microscopy (AFM) to visualize the keratinocytes intercellular structure. The AFM based nanomanipulation system is employed to perform the nanoindentation experiment for measuring keratinocytes nanomechanical property under both physiological and pathophysiological conditions. Our demonstration of the use of AFM for in situ imaging and nanomanipulation for quantifying stiffness in nanoscale can facilitate the investigation of diseases related to blistering and development of therapeutic strategies accordingly.
Keywords
atomic force microscopy; biomechanics; cellular biophysics; nanobiotechnology; nanoindentation; AFM; anchoring cells; animal skins; atomic force microscopy; autoimmune diseases; blistering; cell-cell junctions; desmosome disruption; diseases; hearts; in situ imaging; keratinocyte intercellular structure; keratinocyte stiffness; mechanical strength; nanoindentation; nanomanipulation; nanomechanical property; pathophysiological conditions; tissues; Animal structures; Atomic force microscopy; Atomic measurements; Cardiac disease; Cardiovascular diseases; Heart; Mechanical factors; Performance evaluation; Skin; Visualization; AFM; cell stiffness; desmosome; nanomanipulation;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology, 2009. IEEE-NANO 2009. 9th IEEE Conference on
Conference_Location
Genoa
ISSN
1944-9399
Print_ISBN
978-1-4244-4832-6
Electronic_ISBN
1944-9399
Type
conf
Filename
5394778
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