• DocumentCode
    511794
  • Title

    Testing of pixellated CZT and CdTe detectors at the 200µm level

  • Author

    Jung, G. ; Berry, A. ; Midgley, S. ; Panjkovic, G.

  • Author_Institution
    CRC for Biomed. Imaging Dev. Ltd., Bundoora, VIC, Australia
  • fYear
    2009
  • fDate
    14-16 Dec. 2009
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    Cadmium Zinc Telluride (CZT) and Cadmium Telluride (CdTe) detectors with 200 μm pixellated electrodes were tested with the aim to determine material properties and electrical parameters for hybrid pixel detector (HPD) systems. A 32 channel discrete analogue preamplifier platform was designed and manufactured in which radiation tests were performed on packaged detectors. Although simple in concept, numerous obstacles were encountered as a result of the bump bonding process. This paper provides an overview of HPD development at the Monash Centre for Synchrotron Science, details the tests performed on the current prototype detectors and illustrates the general methodologies used on the development pathway.
  • Keywords
    cadmium compounds; detector circuits; materials testing; preamplifiers; zinc compounds; CdTe; CdTe detectors; CdZnTe; Monash Centre for Synchrotron Science; bump bonding process; channel discrete analogue preamplifier platform; hybrid pixel detector systems; packaged detectors; pixellated CZT testing; radiation tests; size 200 mum; Cadmium compounds; Detectors; Electrodes; Manufacturing; Material properties; Materials testing; Performance evaluation; Preamplifiers; System testing; Zinc compounds; ASIC; CZT; CdTe; X-ray; pixel detector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-9-8108-2468-6
  • Type

    conf

  • Filename
    5403861