DocumentCode
511823
Title
High-accuracy and power-efficient switched-current memory cell
Author
Tang, Xian ; Pun, Kong-Pang
Author_Institution
Dept. of Electron. Eng., Chinese Univ. of Hong Kong, Hong Kong, China
fYear
2009
fDate
14-16 Dec. 2009
Firstpage
276
Lastpage
279
Abstract
In this paper, a simple technique to realize a switched-current memory cell with high accuracy and power efficiency is presented. By setting the memory transistors in triode region, this design reduces distortions due to threshold voltage mismatch as well as clock feedthrough. These characteristics are deduced from theory and verified by simulations. Designed in a 0.18-¿m CMOS process, the switched-current memory cell achieves a simulated performance of over 93.26 dB SINAD at the sampling rate of 2 MS/s with the input signal at the Nyquist frequency of 0.999 MHz. The power consumption is 242 ¿W with a 128 ¿A input current range.
Keywords
CMOS digital integrated circuits; switched current circuits; transistors; triodes; CMOS process; Nyquist frequency; SINAD; input current range; memory transistors; power 242 muW; power consumption; power-efficient switched-current memory cell; sampling rate; size 0.18 mum; triode region; CMOS process; Circuits; Clocks; Energy consumption; Harmonic distortion; Impedance; Power engineering and energy; Signal sampling; Switches; Threshold voltage; distortion; switched-current memory cell; triode region;
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Circuits, ISIC '09. Proceedings of the 2009 12th International Symposium on
Conference_Location
Singapore
Print_ISBN
978-9-8108-2468-6
Type
conf
Filename
5403891
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