DocumentCode :
511987
Title :
Research on dielectric properties of gallium arsenides by using THz-TDS
Author :
Li, Jiusheng ; Zhao, Xiaoli ; Li, Jianrui
Author_Institution :
Centre for THz Research, China Jiliang University, Hangzhou 310018, China
Volume :
2009-Supplement
fYear :
2009
fDate :
2-6 Nov. 2009
Firstpage :
1
Lastpage :
6
Abstract :
By using terahertz time domain spectroscopy (THz-TDS) system, the terahertz dielectric properties of various gallium arsenides were tested in the frequency range extending from 0.2 to 1.5 THz. The power absorption coefficient and refractive index of various resistivity gallium arsenides were measured and compared. The refractive index of the high resistivity and ultra-high resistivity GaAs are equal to be 6.53 and 5.9, respectively. The variation of the refractive index of the GaAs was less than 1%, ranging from 0.2 to 1.5THz, but the absorption coefficient of the ultra-high resistivity GaAs showed very different frequency-dependent behaviors, ranging from 0.02cm−1 to 2.21cm−1, within the investigated frequency range. The results show that the ultra-high resistivity GaAs will be a good candidate material for terahertz transmission waveguide.
Keywords :
Conductivity; Dielectric measurements; Electrochemical impedance spectroscopy; Electromagnetic wave absorption; Extraterrestrial measurements; Frequency; Gallium arsenide; Laser beams; Refractive index; Ultrafast optics; Spectroscopy; THz; absorption coefficient; gallium arsenides; refractive index; spectral characteristics; time-domain;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Communications and Photonics Conference and Exhibition (ACP), 2009 Asia
Conference_Location :
Shanghai, China
Print_ISBN :
978-1-55752-877-3
Electronic_ISBN :
978-1-55752-877-3
Type :
conf
Filename :
5405250
Link To Document :
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