• DocumentCode
    512003
  • Title

    Silicon-based long wavelength photodetectors

  • Author

    Cheng, Buwen ; Xue, Haiyun ; Xue, Chunlai ; Li, Chuanbo ; Cheng Li ; Hu, Weixuan ; Zuo, Yuhua ; Wang, Qiming

  • Author_Institution
    State Key Laboratory on Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing, 100083, China
  • Volume
    2009-Supplement
  • fYear
    2009
  • fDate
    2-6 Nov. 2009
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Three types of Si-based photodetectors (PD) operating at long wavelength were introduced: the strained SiGe/Si multi-quantum-wells PD and Ge/Si islands PD with resonant cavity enhanced (RCE) structure, Ge p-i-n PD on silicon and SOI, Ge/Si avalanche photodetectors (APDs) with separate absorption, charge and multiplication (SACM) structure. The strained SiGe/Si MQW RCE PD and Ge/Si islands RCE PD has a threefold enhanced responsivity compared with the conventional PD without a resonant cavity. The Ge p-i-n PD on SOI has a responsivity of 0.65 A/W at 1.31µm and 0.32 A/W at 1.55µm. The 3dB bandwidth is 13.3GHz at reverse bias of 3 V. The Ge/Si SACM APD operating at 1310 nm have a responsivity of 4.4A/W (with a gain of 8.8) biased at 90% of break voltage.
  • Keywords
    Absorption; Distributed Bragg reflectors; Germanium silicon alloys; Mirrors; Optical interconnections; PIN photodiodes; Photodetectors; Quantum well devices; Resonance; Silicon germanium; APD; Ge; SiGe; Silicon-based; photodetector;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications and Photonics Conference and Exhibition (ACP), 2009 Asia
  • Conference_Location
    Shanghai, China
  • Print_ISBN
    978-1-55752-877-3
  • Electronic_ISBN
    978-1-55752-877-3
  • Type

    conf

  • Filename
    5405268