DocumentCode :
512386
Title :
Approach for recognition of true and false specific sample points
Author :
Bin, Bai ; Hongli, Wang ; Yarong, Gao ; Jianxiao, Guo
Author_Institution :
Sch. of Manage., Tianjin Univ., Tianjin, China
Volume :
1
fYear :
2009
fDate :
28-29 Nov. 2009
Firstpage :
365
Lastpage :
368
Abstract :
In the process of data mining, a major obstacle of using mathematical analysis to study the patterns and trends hidden in the data is the specific sample points existed in large-scale data sets. According to the ratio of specific sample points to the sample size, taking into account other factors at the same time, specific sample points may be divided into true and false specific sample points. For the first time, the paper proposes the discriminant formula for recognizing true and false specific sample points based on the first m principal components, which is also base on the re-definition of discriminant formula for the first 3 principal components. The construction principle of critical value formula is also analyzed. These concepts, formulas and conclusions have important reference values on eliminating the sample points interfered with random factors, a reasonable selection of index set and refining models.
Keywords :
data mining; least squares approximations; pattern recognition; critical value formula; data mining; discriminant formula; false specific sample points; mathematical analysis; true specific sample points; Computational intelligence; Computer industry; Conference management; Data mining; Electronic mail; Engineering management; Mathematical analysis; Mathematical model; Mining industry; Pattern recognition; critical value; data mining; partial least-squares; specific sample points;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Intelligence and Industrial Applications, 2009. PACIIA 2009. Asia-Pacific Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4606-3
Type :
conf
DOI :
10.1109/PACIIA.2009.5406416
Filename :
5406416
Link To Document :
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