Title :
Potential materials for avalanche photodiodes operating above 10Gb/s
Author :
Tan, C.H. ; Ng, J.S. ; Xie, S. ; David, J.P.R.
Author_Institution :
Dept. of Electron. & Electr. Eng., Univ. of Sheffield, Sheffield, UK
Abstract :
Avalanche photodiodes have been the preferred choice for detection of signals at the bit-rates of 2.5Gb/s and 10Gb/s in optical communication networks. Current commercial avalanche photodiodes are unable to meet the demand at higher bit-rates above 10Gb/s. A review of the gain-bandwidth products reported in InP, InAlAs and Si based avalanche photodiodes is presented. We discussed the physics of avalanche photodiodes that determine the bandwidth. The effects of avalanche region width, ionization coefficient ratio, dead space and carrier velocity are considered to understand potential strategies to increase the. The advantages of adopting materials including AlGaAs, InAs and Si as multiplication layers are presented.
Keywords :
III-V semiconductors; aluminium compounds; avalanche photodiodes; elemental semiconductors; gallium arsenide; indium compounds; optical communication; optical signal detection; silicon; AlGaAs; InAlAs; InP; Si; avalanche photodiodes; carrier velocity; dead space; gain-bandwidth products; ionization coefficient ratio; multiplication layers; optical communication networks; signal detection; Absorption; Avalanche photodiodes; Electromagnetic radiation; Impact ionization; Indium compounds; Indium gallium arsenide; Indium phosphide; Optical fiber communication; Optical materials; Signal to noise ratio; 10Gb/s; 40Gb/s; AlGaAs; Avalanche photodiodes; InAs; InGaAsN; gain-bandwidth product; impact ionization;
Conference_Titel :
Computers and Devices for Communication, 2009. CODEC 2009. 4th International Conference on
Conference_Location :
Kolkata
Print_ISBN :
978-1-4244-5073-2