Title :
Research for digital circuit fault testing and diagnosis techniques
Author :
Wei, Su ; Tongshun, Fan ; Mingfang, Du
Author_Institution :
Beijing Union Univ., Beijing, China
Abstract :
On basis of scientific research projects recently fulfilled by the author, and through detailed analysis for more than 30 LASAR circuit simulation result documentations, this paper makes a detailed description of fault diagnosis software development process, which provides design basis for relevant development of circuit fault simulation software. The assay stipulates data domain testing technology and its approaches; on basis of testing system comprehensive description, realizing process of fault diagnosis software is states accordingly. In the research, LASAR (logic automatic stimulate and response) circuit simulation results fault dictionary and VXI bus technology are adopted, and Lab Windows/CVI for dummy instrument software development environment are used as the platform for fault diagnosis software development.
Keywords :
circuit testing; digital circuits; logic circuits; software fault tolerance; Lab Windows-CVI; VXI bus technology; digital circuit fault testing; dummy instrument software development; fault diagnosis software development process; fault dictionary; logic automatic stimulate and response circuit simulation; Circuit faults; Circuit simulation; Circuit testing; Digital circuits; Documentation; Fault diagnosis; Process design; Programming; Software testing; System testing; LASAR; Lab Windows/CVI; circuit simulation; fault-diagnosis program; fault-dictionary;
Conference_Titel :
Test and Measurement, 2009. ICTM '09. International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4699-5
DOI :
10.1109/ICTM.2009.5412926