Title :
A new noise aided method for random data analysis
Author :
Chang, Jincai ; Yang, Aimin ; Gong, Dianxuan ; Wang, Ling
Author_Institution :
Sch. of Sci., Hebei Polytech. Univ., Tangshan, China
Abstract :
The Empirical Mode Decomposition(EMD) is a simple and effective sifting process which can decompose complicated data set into Intrinsic Mode Functions (IMFs). But neither the origin EMD nor its recent progress considered the randomness of data sufficiently. In this paper, random splines are introduced as a new approximation tool for random data analysis. According to the randomness of data itself, we present Random Empirical Mode Decomposi-tion (REMD) to decompose random data set into Random Intrinsic Mode Functions (RIMFs).
Keywords :
data analysis; splines (mathematics); empirical mode decomposition; intrinsic mode functions; noise aided method; random data analysis; random empirical mode decomposition; random intrinsic mode functions; sifting process; Biomedical measurements; Data analysis; Geophysical measurements; Noise measurement; Polynomials; Random variables; Spectral analysis; Stochastic processes; Testing; Time series analysis; EMD; IMF; REMD; RIMF; Random spline;
Conference_Titel :
Test and Measurement, 2009. ICTM '09. International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4699-5
DOI :
10.1109/ICTM.2009.5412934