Title :
Multiple Crop Yield prediction using dual-polarimetric TerraSAR-X stripmap imagery
Author :
Dhar, T. ; Gray, Doug ; Menges, Carl
Author_Institution :
Apogee Imaging Int., Lobethal, SA, Australia
Abstract :
This paper presents the results of an experiment carried out to relate the yield from various crops to TerraSAR-X dual polarimetric imagery. X-band wavelength has higher sensitivity to smaller crop structures, especially stem and head density making it suitable for relating yield to backscatter. The coherent dual-polarimetric mode of TerraSAR-X was also used to emphasize the volume scattering through dual-polarimetric entropy/alpha decomposition. Good correlations to yield data as gathered by harvester telemetry were obtained.
Keywords :
backscatter; radar polarimetry; remote sensing by radar; synthetic aperture radar; vegetation; vegetation mapping; backscatter; crop structure; dual polarimetric TerraSAR-X stripmap imagery; entropy/alpha decomposition; harvester telemetry; head density; multiple crop yield prediction; stem density; Crops; Crop Yield; Dual-polarimetry; Entropy/Alpha; TerraSAR-X;
Conference_Titel :
Geoscience and Remote Sensing Symposium,2009 IEEE International,IGARSS 2009
Conference_Location :
Cape Town
Print_ISBN :
978-1-4244-3394-0
Electronic_ISBN :
978-1-4244-3395-7
DOI :
10.1109/IGARSS.2009.5417799
