Multiple Crop Yield prediction using dual-polarimetric TerraSAR-X stripmap imagery

This paper presents the results of an experiment carried out to relate the yield from various crops to TerraSAR-X dual polarimetric imagery. X-band wavelength has higher sensitivity to smaller crop structures, especially stem and head density making it suitable for relating yield to backscatter. The coherent dual-polarimetric mode of TerraSAR-X was also used to emphasize the volume scattering through dual-polarimetric entropy/alpha decomposition. Good correlations to yield data as gathered by harvester telemetry were obtained.