DocumentCode
513169
Title
Modeling the effect of surface roughness on the back-scattering coefficient and emissivity of a soil-litter medium using a numerical model
Author
Lawrence, H. ; Demontoux, F. ; Wigneron, J.-P. ; Kerr, Y. ; Wu, T.-D. ; Borderies, P. ; Paillou, P. ; Chen, L. ; Shi, J.-C.
Author_Institution
MCM Dept., Univ. of Bordeaux 1, Bordeaux, France
Volume
3
fYear
2009
fDate
12-17 July 2009
Abstract
In the context of the SMOS mission, a new numerical method based on the finite element method is presented which can be used to model the radiometric L-band emission of soil and litter layers in forests. Many different characteristics of these layers that affect the soil-litter emission can be incorporated into the model, including surface roughness, inclusions and volume effects. Soil moisture is incorporated into the model as a function of the dielectric permittivity constant. The model is validated for a single dielectric layer with a surface roughness of Gaussian autocorrelation function by comparing results of the backscattering coefficient with those calculated by the 2D method of moments. Good general agreement is obtained between these results. An emissivity calculation for a single layer rough surface is also presented and compared with the emissivity of a flat layer.
Keywords
backscatter; finite element analysis; hydrological techniques; radiometry; soil; surface roughness; 3D numerical model; Gaussian autocorrelation function; SMOS mission; backscattering coefficient; dielectric permittivity constant; emissivity calculation; finite element method; forests; microwave radiometry; radiometric L-band emission; single layer rough surface; soil moisture; soil-litter medium; surface roughness; Context modeling; Dielectric constant; Finite element methods; L-band; Numerical models; Radiometry; Rough surfaces; SMOS mission; Soil moisture; Surface roughness; 3D numerical model; SMOS mission; microwave radiometry; rough surfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium,2009 IEEE International,IGARSS 2009
Conference_Location
Cape Town
Print_ISBN
978-1-4244-3394-0
Electronic_ISBN
978-1-4244-3395-7
Type
conf
DOI
10.1109/IGARSS.2009.5417805
Filename
5417805
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