• DocumentCode
    513585
  • Title

    Measurement of uncertainty in Electrical Fast Transient test

  • Author

    Vincentraj, G. ; Mahesh, G. ; Sivaramakrishnan, R.

  • Author_Institution
    Centre for Electromagn., SAMEER, Chennai, India
  • fYear
    2006
  • fDate
    23-24 Feb. 2006
  • Firstpage
    312
  • Lastpage
    316
  • Abstract
    Electrical Fast Transients (EFT) are commonly generated by relay chattering, interruption of inductive load, etc. IEC 61000-4-4 standard describes about the immunity requirements, test method / procedures and specifications for conducting the EFT test. The EFT test is applicable for almost all electrical / electronic products for `CE marking´. The quantification of measurement uncertainty for any EMC test including EFT test is a main concern nowadays. Standards like CISPR 16-4 explain about measurement uncertainty for Conducted Emission & Radiated Emission tests. They do not cover the conducted immunity tests. Publications like LAB 34 specify briefly about measurement uncertainty of conducted transient immunity measurement. An effort has been made in this paper to calculate and present the measurement uncertainty of EFT test on the basis of LAB 34 guidelines.
  • Keywords
    IEC standards; electromagnetic compatibility; electronic products; immunity testing; measurement uncertainty; CE marking; CISPR 16-4 standard; EFT test; EMC test; IEC 61000-4-4 standard; conducted emission & radiated Emission tests; electrical fast transient test; electrical products; electronic products; immunity testing; measurement uncertainty; relay chattering; Electric variables measurement; Electromagnetic compatibility; Electromagnetic measurements; Electronic equipment testing; IEC standards; Immunity testing; Measurement standards; Measurement uncertainty; Performance evaluation; Q measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ElectroMagnetic Interference and Compatibility (INCEMIC), 2006 Proceedings of the 9th International Conference on
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-5203-3
  • Type

    conf

  • Filename
    5419721