• DocumentCode
    513638
  • Title

    PMOSFET Hot-Carrier Degradation Mechanisms

  • Author

    Woltjer, Reinout ; Paulzen, Ger M.

  • Author_Institution
    Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands
  • fYear
    1995
  • fDate
    25-27 Sept. 1995
  • Firstpage
    295
  • Lastpage
    298
  • Keywords
    Current density; Degradation; Electrical resistance measurement; Electrons; Hot carriers; Interface states; Laboratories; MOSFET circuits; Predictive models; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
  • Conference_Location
    The Hague, The Netherlands
  • Print_ISBN
    286332182X
  • Type

    conf

  • Filename
    5435879
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=513638