DocumentCode :
513638
Title :
PMOSFET Hot-Carrier Degradation Mechanisms
Author :
Woltjer, Reinout ; Paulzen, Ger M.
Author_Institution :
Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands
fYear :
1995
fDate :
25-27 Sept. 1995
Firstpage :
295
Lastpage :
298
Keywords :
Current density; Degradation; Electrical resistance measurement; Electrons; Hot carriers; Interface states; Laboratories; MOSFET circuits; Predictive models; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Conference_Location :
The Hague, The Netherlands
Print_ISBN :
286332182X
Type :
conf
Filename :
5435879
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=513638
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