• DocumentCode
    513640
  • Title

    Neural Networks for the Design and Reverse Engineering of BJTs

  • Author

    Ferguson, Ryan ; Roulston, David J.

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Waterloo, Waterloo, Ontario, Canada N2L 3G1
  • fYear
    1996
  • fDate
    9-11 Sept. 1996
  • Firstpage
    969
  • Lastpage
    972
  • Abstract
    We have developed a neural network based software tool, REED (Rapid Engineering of Electron Devices) that maps an electrical description of a bipolar transistor to its physical structure, as described by mask geometries and a doping profile.
  • Keywords
    Backpropagation algorithms; Bipolar transistors; Design engineering; Doping profiles; Electrons; Neural networks; Reverse engineering; SPICE; Semiconductor process modeling; Software tools;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    286332196X
  • Type

    conf

  • Filename
    5435881