• DocumentCode
    513672
  • Title

    Low-Power, Ultra-Low Capacitance Bipolar Transistor Compatible with Mainstream CMOS

  • Author

    van der Wel, Wim ; Koster, Ronald ; Jansen, Sander ; Hurkx, Fred ; Bladt, Ed

  • Author_Institution
    Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA Eindhoven, The Netherlands
  • fYear
    1995
  • fDate
    25-27 Sept. 1995
  • Firstpage
    425
  • Lastpage
    428
  • Abstract
    A 10-mask 0.5-¿m process is presented which combines three viable technology modules to achieve very small capacitances in a bipolar NPN transistor, whereas compatibility with mainstream CMOS is maintained. Shallow and deep trenches reduce the collector/base and collector/substrate capacitances by more than 50 %. Straps minimise dimensions of the active region by more than 50 %. Application of the Poly-Ridge Emitter Transistor (PRET) concept strongly reduces both base and emitter areas by 33 and 60 %, respectively. Capacitances are lower than conventional 0.5 ¿m-devices by a factor ranging between 2 and 5, whereas high-frequency capability and CMOS compatibility are maintained.
  • Keywords
    Bipolar transistors; CMOS process; CMOS technology; Carbon capture and storage; Energy consumption; Etching; Laboratories; Parasitic capacitance; Planarization; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
  • Conference_Location
    The Hague, The Netherlands
  • Print_ISBN
    286332182X
  • Type

    conf

  • Filename
    5435922