• DocumentCode
    513713
  • Title

    Linear and Enhanced Transconductance using High-Medium-Low Doped Channel

  • Author

    Lour, Wen-Shiung ; Liu, Wen-Chau ; Tsai, Jung-Hui ; Laih, Lih-Wen

  • Author_Institution
    Department of Electrical Engineering, National Taiwan Ocean University, 2 Peining Rd., Keelung, TAIWAN, Republic of China.
  • fYear
    1995
  • fDate
    25-27 Sept. 1995
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    We report linear, enhanced transconductance by high-medium-low doped-channel FET. A low-doped layer together with n+ and p+ layers establishes high-performance camel diode, which exhibits a high effective potential barrier of ≫ 1.0 V and a gate-drain breakdwon voltage of around 21 V (at Ig= 1.0 mA/mm). Whereas the transition and the thin, high-doped layers used to enhance transconductance and to improve device linearity. A 1.5×100 ¿m2 camel-diode gate FET (CAMFET) has a peak transconductance of 220 mS/mm and a current density of ≫ 800 mA/mm. On the other hand, the device has a transconductance of more than 80 percent of the peak value over a wide drain current range of 160 to 800 mA/mm. The improvement of device linearity and the enhancement of current density suggest that high-medium-low doped channel for a CAMFET is suitable for high power large signal circuit applications.
  • Keywords
    Breakdown voltage; Current density; Current measurement; Diodes; FETs; Linearity; MESFET circuits; Oceans; Thickness measurement; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
  • Conference_Location
    The Hague, The Netherlands
  • Print_ISBN
    286332182X
  • Type

    conf

  • Filename
    5435978