DocumentCode :
513780
Title :
Porous Silicon Micromachining Techniques for Accelerometer Fabrication
Author :
Gennissen, PT J. ; French, RJ ; De Munter, D.P.A. ; Bell, T.E. ; Kaneko, H. ; Sarro, P.M.
Author_Institution :
Lab. for Electronic Instrumentation, Dept. of Electrical Eng., Delft University of Technology, The Netherlands. Tel +31-15-783342, Fax +31-15-785755
fYear :
1995
fDate :
25-27 Sept. 1995
Firstpage :
593
Lastpage :
596
Abstract :
In this paper an epi-micromachining technique is presented which combines the advantages of both surface and bulk micromachining. The process is based on the use of a buried sacrificial porous layer and offers high flexibility. Horizontal and vertical accelerometer structures have been fabricated using the epitaxial layer as construction material. Buried p+ silicon was used as sacrificial material by selective porous formation of this layer. P+ silicon can be made porous by anodic etching in HF. This porous layer can later be removed using diluted KOH at room temperature.
Keywords :
Accelerometers; Building materials; Crystal microstructure; Current density; Epitaxial layers; Etching; Fabrication; Hafnium; Micromachining; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Conference_Location :
The Hague, The Netherlands
Print_ISBN :
286332182X
Type :
conf
Filename :
5436059
Link To Document :
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