• DocumentCode
    513783
  • Title

    Pulsed Laser Deposition as a Novel Thin Film Preparation Method for Silicon-Based Field Effect Sensors

  • Author

    Schoning, M.J. ; Schaub, A. ; Zundel, A. ; Beckers, L. ; Schubert, J. ; Zander, W. ; Kordos, P. ; Lüth, H.

  • Author_Institution
    Institut fÿr Schicht- und Ionentechnik, Forschungszentrum Jÿlich GmbH, D-52425 Jÿlich, Germany
  • fYear
    1995
  • fDate
    25-27 Sept. 1995
  • Firstpage
    601
  • Lastpage
    604
  • Abstract
    Silicon-based field effect sensors for the H+-ion detection in liquids have been realized by using the PLD (Pulsed Laser Deposition) technique. Therefore A12O3 as a pH sensitive gate insulator material was deposited on top of a capacitive field effect structure, built up of Al/Si/SiO2. The sensor properties like sensitivity and stability of the obtained EIS (Electrolyte-Insulator-Semiconductor) heterostructures were studied by means of C/V (Capacitance/Voltage) measurements. The sensor device shows a high, near-Nernstian pH sensitivity of about 54-56 mV per pH decade in the concentration range pH=3 to pH=10. Moreover a small baseline drift of the sensor output signal of less than 1 mV per day over a measurement period of at least 6 months during permanent electrolyte exposure was found. The sensors can be produced at low cost. Owing to the identical layer sequence of the fabricated EIS structures, the resulting process can be applied to the gate of an ISFET (Ion Sensitive Field Effect Transistor) device.
  • Keywords
    Capacitive sensors; Insulation; Liquids; Optical materials; Optical pulses; Pulsed laser deposition; Semiconductor thin films; Sputtering; Stability; Thin film sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
  • Conference_Location
    The Hague, The Netherlands
  • Print_ISBN
    286332182X
  • Type

    conf

  • Filename
    5436062