Title :
Superimposed Bragg Gratings on Semiconductor Material
Author :
Talneau, A. ; Charil, J. ; Ougazzaden, A.
Author_Institution :
FRANCE TELECOM / CNET / PAB, 196 rue H. Ravera, BP 107, 92225 BAGNEUX FRANCE
Abstract :
We report the transfert of six Bragg gratings at the same location into semiconductor material. Measurements on an active device demonstrates that all the gratings have the same efficiency on guided light. This technology is an attractive alternative to sampling effect to provide the multiwavelength filter functionnality at predefined wavelengths.
Keywords :
Bragg gratings; Dielectric measurements; Diffraction gratings; Etching; Fiber gratings; III-V semiconductor materials; Plasma measurements; Resists; Satellites; Semiconductor materials;
Conference_Titel :
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location :
Bologna, Italy
