DocumentCode :
513866
Title :
Leakage Current in Polysilicon TFTs: Experiments and Interpretation
Author :
Colalongo, L. ; Valdinoci, M. ; Baccarani, G. ; Migliorato, Piero ; Tallarida, G. ; Reita, C.
Author_Institution :
DEIS, UniversitÃ\xa0 di Bologna, Italy; DIM, UniversitÃ\xa0 di Trento, Italy
fYear :
1996
fDate :
9-11 Sept. 1996
Firstpage :
415
Lastpage :
418
Abstract :
Polycrystalline silicon thin-film transistors (poly-TFTs) are getting more and more attractive for Active-Matrix Liquid Crystal Displays (AMLCDs) and, more generally, for large-area electronic products. Anomalously high off-currents, however, are an important limiting factor preventing a wide use of poly-TFTs. The purpose of this work is that of investigating the anomalously large leakage-currents in (poly-TFTs) by numerical simulation, taking into account the effect of energy-distributed traps and field-enhanced generation mechanisms.
Keywords :
Active matrix liquid crystal displays; Active matrix technology; Electron emission; Electron traps; Leakage current; Silicon; Temperature dependence; Thin film transistors; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location :
Bologna, Italy
Print_ISBN :
286332196X
Type :
conf
Filename :
5436224
Link To Document :
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