Title :
Automated Measurement of the Bias Dependence of Low Frequency Small-signal Parameter Dispersions in GaAs MESFETs
Author :
Defreitas, M.T. ; Swanson, J.G.
Author_Institution :
Department of Electronic & Electrical Engineering, King´´s College London, Strand, LONDON WC2R 2LS, U.K.
Abstract :
An automated system has been developed which measures the small-signal gm and go of FET´s over a wide bias and frequency range. This behaviour has been investigated in GaAs MESFET´s and several distinct mechanisms have been observed. Backgating has also been measured and related to the gm dispersions of the same device.
Keywords :
Dispersion; Electric variables measurement; Frequency dependence; Frequency measurement; Gallium arsenide; Impedance; MESFETs; Operational amplifiers; Resonance; Testing;
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany
