DocumentCode :
514005
Title :
A Salicide Base Contact Technology (SCOT) for Use in High Speed Bipolar VLSI
Author :
Hirao, Tadashi ; Ikeda, Tatsuhiko ; Kuramisu, Yoichi
Author_Institution :
LSI Research and Development Laboratory, Mitsubishi Electric Corporation, 4-1 Mizuhara, Itami, P.O.Box. 664, Japan.
fYear :
1987
fDate :
14-17 Sept. 1987
Firstpage :
373
Lastpage :
376
Abstract :
This paper describes a new process technology, which is called SCOT: salicide (self-aligned silicide) base contact technology, and applied for realizing high performance prescaler IC and high gate density masterslice LSI. The main feature of this process, for reduction of the base resistance and capacitance, is a silicidation of the base contact which is opened by employing self-alignment technology. A 1/128, 1/129 two-modulus prescaler IC constructed of the 1.5 ¿m SCOT transistors has been improved to a high operation of 2.1 GHz at 56-mW power dissipation. An ECL 18K-gate masterslice has been developed by a variable size cell (VSC) approach, employing the SCOT process.
Keywords :
Automotive electronics; Capacitance; Etching; Frequency; Large scale integration; Power dissipation; Resistors; Silicidation; Silicides; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
Print_ISBN :
0444704779
Type :
conf
Filename :
5436622
Link To Document :
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