DocumentCode :
514007
Title :
Reduction of Titanium Silicide Degradation During Borophosphosilicate Glass Reflow
Author :
Burmester, R. ; Joswig, H. ; Mitwalsky, A.
Author_Institution :
Siemens AG, Corporate, Research and Development, Otto-Hahn-Ring 6, D-8000 Mÿnchen 83, F.R.G
fYear :
1989
fDate :
11-14 Sept. 1989
Firstpage :
233
Lastpage :
236
Abstract :
The application of a self-aligned silicide (``salicide´´) process with Ti requires reduction of following excessive heat-treatment [1]. E.g. a commonly used borophosphosilicate glass (BPSG) reflow process (900 °C, 40 min, N2 has been found to cause severe morphological degradation of the TiSi2 layer [2] resulting in higher sheet resistance (RS). On the other hand the use of BPSG is advantageous because of its planarization capabilities and its gettering function of mobile alkali ions [3]. In this contribution the degradation mechanism and the influence of process parameters are investigated. As a result a Ti salicide process was established which was able to withstand following isolation oxide processes with temperatures of 900° C.
Keywords :
Degradation; Glass; Optical microscopy; Silicides; Silicon; Sputter etching; Surface finishing; Surface treatment; Titanium; Wet etching;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany
Print_ISBN :
0387510001
Type :
conf
Filename :
5436624
Link To Document :
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