Title :
3D Simulation of Parasitic Effects in EPROM Cells
Author :
Ciampolini, P. ; Pierantoni, A. ; Rudan, M. ; Baccarani, G.
Author_Institution :
Dipartimento di Elettronica, Informatica e Sistemistica, Universitá di Bologna, viale Risorgimento 2, 1-40136, Bologna
Keywords :
EPROM; Electrons; Geometry; Insulation testing; MOSFETs; Performance loss; Poisson equations; Semiconductor devices; Solid modeling; Tin;
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany
