DocumentCode :
514034
Title :
Numerical Analysis of Breakdown in Silicon Diodes
Author :
Quade, W. ; Rudan, M.
Author_Institution :
Dipartimento di Elettronica, Informatica e Sistemistica, Universitá di Bologna, viale Risorgimento 2, 40136 Bologna, Italy; Dipartimento di Fisica, Universitá di Modena, via G. Campi 213/A, 41100 Modena, Italy
fYear :
1989
fDate :
11-14 Sept. 1989
Firstpage :
97
Lastpage :
100
Keywords :
Charge carrier processes; Current density; Diodes; Electric breakdown; Integral equations; Large Hadron Collider; Nominations and elections; Numerical analysis; Silicon; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1989. ESSDERC '89. 19th European
Conference_Location :
Berlin, Germany
Print_ISBN :
0387510001
Type :
conf
Filename :
5436659
Link To Document :
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