DocumentCode

514085

Title

High Resolution Intrinsic MOS Capacitance-Measurement System

Author

Leclaire, P.

Author_Institution

BULL S.A. - B2/028, Rue Jean Jaurÿs, 78340 Les Clayes-Sous-Bois - France

fYear

1987

fDate

14-17 Sept. 1987

Firstpage

699

Lastpage

702

Keywords

Aging; Capacitance measurement; Capacitance-voltage characteristics; Capacitors; Circuits; Geometry; Hot carriers; MOSFETs; SPICE; Solid modeling;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid State Device Research Conference, 1987. ESSDERC '87. 17th European

Conference_Location

Bologna, Italy

Print_ISBN

0444704779

Type

conf

Filename

5436732