• DocumentCode
    514093
  • Title

    The Influence of Lifetime on the Lateral Pasitic Bipolar Transistors in CMOS

  • Author

    Deferm, L. ; Romaen, G. ; Claeys, C. ; Mertens, R.

  • Author_Institution
    I M. E. C., Kapeldreef, 75 B-3030 Leuven - Belgium
  • fYear
    1987
  • fDate
    14-17 Sept. 1987
  • Firstpage
    775
  • Lastpage
    778
  • Abstract
    The electrical characteristics of lateral bipolar transistors are very important in predicting latch-up. An increase of the current amplification factor is noticed when the high current level injection regime is reached, but this only for devices with a relative low base carrier lifetime. For low minority carrier lifetimes in the base the beta versus collector curve will show a bump.
  • Keywords
    Bipolar transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    0444704779
  • Type

    conf

  • Filename
    5436741