• DocumentCode
    51425
  • Title

    Characterization of POCl _{3} -Based Codiffusion Processes for Bifacial N-Type Solar Cells

  • Author

    Rothhardt, Philip ; Meier, Sebastian ; Maier, Stefan ; Kaiyun Jiang ; Wolf, Alon ; Biro, Daniel

  • Author_Institution
    Fraunhofer Inst. for Solar Energy Syst. ISE, Freiburg, Germany
  • Volume
    4
  • Issue
    3
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    827
  • Lastpage
    833
  • Abstract
    Bifacial n-type silicon solar cells typically feature two highly doped areas, namely, a boron-doped emitter and phosphorus-doped back-surface field (BSF). Complexity of the process sequence for forming these highly doped areas is one of the major obstacles for industrial application. This study investigates a POCl3-based codiffusion process that allows for forming boron-doped emitter and phosphorus-doped BSF in one single high-temperature step. As a boron source, we use a borosilicate-glass (BSG) layer deposited before the diffusion process using atmospheric pressure chemical vapor deposition. We discuss the influence of the POCl3 concentration in the process atmosphere with respect to recombination and contact formation of the BSF. By tuning the POCl3 concentration, we achieve specific contact resistances of screen printed contacts below 5 mΩ-cm2 and dark saturation current densities below 160 fA/cm2 on a textured surface. We present solar cell results on 156-mm n-type Cz wafers with peak efficiencies of 19.6%.
  • Keywords
    boron; borosilicate glasses; chemical vapour deposition; contact resistance; current density; dark conductivity; diffusion; elemental semiconductors; phosphorus; phosphorus compounds; semiconductor growth; silicon; solar cells; surface texture; POCl3-based codiffusion processes; Si:P-Si:B; atmospheric pressure chemical vapor deposition; bifacial N-type solar cells; boron-doped emitter; borosilicateglass layer; contact resistances; dark saturation current density; n-type Cz wafers; phosphorus-doped back-surface field; screen printed contacts; size 156 nm; textured surface; Boron; Contact resistance; Diffusion processes; Photovoltaic cells; Surface resistance; Surface treatment; Diffusion; n-type; photovoltaic cells;
  • fLanguage
    English
  • Journal_Title
    Photovoltaics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    2156-3381
  • Type

    jour

  • DOI
    10.1109/JPHOTOV.2014.2309803
  • Filename
    6778059