DocumentCode :
514535
Title :
Single input single output technology in 802.11n
Author :
Moghe, Sneha ; Upadhyay, Raksha
Author_Institution :
Dept. of Electron. & Commun., Truba Inst. of Technol. & Sci., Indore, India
fYear :
2009
fDate :
22-24 Dec. 2009
Firstpage :
247
Lastpage :
249
Abstract :
In this paper we are introducing a new generation of 802.11n wireless network standard. The objective is to obtain numerical values for various measures of networking performance of 802.11n by simulating the system using Simulink. Our initial approach was to investigate the abilities of 802.11n standard to model a transmitter and receiver that communicated over a user defined channel. In wireless communications systems, the transmitted signal is distorted by fading and interference. If antennas are not spaced enough to achieve an independent fading, this can lead to loss in diversity benefits. Traditional wireless communication systems use a single antenna for transmission and a single antenna for reception. Such systems are known as single input single output (SISO) systems. We simulated a single OFDM symbol SISO system and demonstrated visually how the performance of the system gradually increases by increasing signal-to-noise ratio (SNR). We also tested the performance of the system using Matlab´s built in bit-error rate (BER) tool.
Keywords :
IEEE standards; OFDM modulation; diversity reception; error statistics; intersymbol interference; radio networks; wireless LAN; wireless channels; IEEE 802.11n; OFDM symbol; SISO systems; Simulink; bit error rate; diversity benefits; fading; interference; receiver; single antenna; single input single output technology; transmitter; user defined channel; wireless network standard; Antenna measurements; Bit error rate; Communication standards; Distortion measurement; Fading; Mathematical model; Transmitters; Transmitting antennas; Wireless communication; Wireless networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Emerging Trends in Electronic and Photonic Devices & Systems, 2009. ELECTRO '09. International Conference on
Conference_Location :
Varanasi
Print_ISBN :
978-1-4244-4846-3
Type :
conf
DOI :
10.1109/ELECTRO.2009.5441124
Filename :
5441124
Link To Document :
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