• DocumentCode
    514735
  • Title

    BCRLS Identification Method for Hammerstein-Wiener Model

  • Author

    Li, Yan ; Mao, Zhi-zhong ; Wang, Yan

  • Author_Institution
    Sch. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China
  • Volume
    1
  • fYear
    2010
  • fDate
    13-14 March 2010
  • Firstpage
    745
  • Lastpage
    748
  • Abstract
    In this paper, an improved two-stage on-line identification algorithm is presented to identify Hammerstein-Wiener systems with process disturbance. The proposed algorithm consists of two steps: Firstly, the bias compensation recursive least squares method is adopted to identify the parameter products of original system. By introducing a correction term in the estimate of recursive least squares, the estimation bias caused by process noise is compensated. Secondly, the average method is employed to separate original system parameters. The simulation shows that the proposed algorithm is effective.
  • Keywords
    least squares approximations; stochastic processes; BCRLS identification method; Hammerstein-Wiener model; bias compensation recursive least squares method; online identification algorithm; Area measurement; Capacitance; Current measurement; Fault currents; Frequency diversity; Genetic mutations; Grounding; Transient analysis; Wavelet analysis; Wavelet packets; Hammerstein-Wiener systems; average method (AVE); bias compensation recursive least squares (BCRLS); parameter identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
  • Conference_Location
    Changsha City
  • Print_ISBN
    978-1-4244-5001-5
  • Electronic_ISBN
    978-1-4244-5739-7
  • Type

    conf

  • DOI
    10.1109/ICMTMA.2010.474
  • Filename
    5458870