DocumentCode
514735
Title
BCRLS Identification Method for Hammerstein-Wiener Model
Author
Li, Yan ; Mao, Zhi-zhong ; Wang, Yan
Author_Institution
Sch. of Inf. Sci. & Eng., Northeastern Univ., Shenyang, China
Volume
1
fYear
2010
fDate
13-14 March 2010
Firstpage
745
Lastpage
748
Abstract
In this paper, an improved two-stage on-line identification algorithm is presented to identify Hammerstein-Wiener systems with process disturbance. The proposed algorithm consists of two steps: Firstly, the bias compensation recursive least squares method is adopted to identify the parameter products of original system. By introducing a correction term in the estimate of recursive least squares, the estimation bias caused by process noise is compensated. Secondly, the average method is employed to separate original system parameters. The simulation shows that the proposed algorithm is effective.
Keywords
least squares approximations; stochastic processes; BCRLS identification method; Hammerstein-Wiener model; bias compensation recursive least squares method; online identification algorithm; Area measurement; Capacitance; Current measurement; Fault currents; Frequency diversity; Genetic mutations; Grounding; Transient analysis; Wavelet analysis; Wavelet packets; Hammerstein-Wiener systems; average method (AVE); bias compensation recursive least squares (BCRLS); parameter identification;
fLanguage
English
Publisher
ieee
Conference_Titel
Measuring Technology and Mechatronics Automation (ICMTMA), 2010 International Conference on
Conference_Location
Changsha City
Print_ISBN
978-1-4244-5001-5
Electronic_ISBN
978-1-4244-5739-7
Type
conf
DOI
10.1109/ICMTMA.2010.474
Filename
5458870
Link To Document