Title :
Survivable mapping with maximal physical-layer failure-localization potential in IP over transparent optical networks
Author :
Ni, Wenda ; Ye, Yabin ; Schlosser, Michael ; Patzak, Erwin ; Zhang, Hanyi
Author_Institution :
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
Abstract :
Physical-layer failure-localization potential is explored in finding the survivable mapped lightpaths of IP over transparent optical networks. Numerical results show that accurate or near-accurate failure localizations are achieved with the new survivable mapping design.
Keywords :
IP networks; optical fibre networks; reliability; IP over transparent optical networks; accurate failure localizations; backbone transport networks; maximal physical-layer failure-localization potential; near-accurate failure localizations; survivable mapping; Condition monitoring; Design optimization; Information science; Laboratories; Network topology; Niobium; Optical design; Optical fiber networks; Optical receivers; Spine;
Conference_Titel :
Optical Fiber Communication (OFC), collocated National Fiber Optic Engineers Conference, 2010 Conference on (OFC/NFOEC)
Conference_Location :
San Diego, CA
Electronic_ISBN :
978-1-55752-884-1
