Title :
First 80-Gb/s and 160-Gb/s wavelength-converted data stream measurements in a silicon waveguide
Author :
Ophir, Noam ; Biberman, Aleksandr ; Turner-Foster, Amy C. ; Foster, Mark A. ; Lipson, Michal ; Gaeta, Alexander L. ; Bergman, Keren
Author_Institution :
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Abstract :
Data fidelity is inspected for the first time for wavelength-converted RZ TDM 80- and 160-Gb/s data using four-wave mixing in a silicon waveguide. Open eye diagrams and error-free operation is shown for demultiplexed 10-Gb/s tributaries.
Keywords :
elemental semiconductors; multiwave mixing; optical communication equipment; optical waveguides; optical wavelength conversion; silicon; time division multiplexing; RZ TDM; Si; bit rate 10 Gbit/s; bit rate 160 Gbit/s; bit rate 80 Gbit/s; data fidelity; data stream measurements; error-free operation; four-wave mixing; return-to-zero time division multiplexing; silicon waveguide; wavelength conversion; Fiber nonlinear optics; High speed optical techniques; Nonlinear optics; Optical attenuators; Optical mixing; Optical waveguides; Optical wavelength conversion; Silicon; Ultrafast optics; Wavelength measurement;
Conference_Titel :
Optical Fiber Communication (OFC), collocated National Fiber Optic Engineers Conference, 2010 Conference on (OFC/NFOEC)
Conference_Location :
San Diego, CA
Electronic_ISBN :
978-1-55752-884-1
