Title :
High Reliability Bipolar Integrated Circuits for 565Mbit/s Optical Transmission Systems
Author :
Flavin, P.G. ; Hawker, I. ; Scott, D.L. ; Whitt, Spencer ; Blau, G.
Author_Institution :
British Telecom Research Laboratories, Martlesham Heath, IPSWICH IP5 7RE, England.
Abstract :
A number of ECL integrated circuit designs, based on high reliability uncommitted logic arrays, are being developed at BTRL to enable the upgrading of the UK trunk transmission network from 140Mbit/s to 565Mbit/s. The performance of two of the designs has been reported in this paper, and it has been shown that the components offer ample speed margin for a fully integrated system.
Keywords :
Bipolar integrated circuits; CMOS technology; Integrated circuit reliability; Integrated circuit technology; Integrated optics; Isolation technology; Low voltage; MOSFETs; Power dissipation; Very large scale integration;
Conference_Titel :
Solid-State Circuits Conference, 1985. ESSCIRC '85. 11th European
Conference_Location :
Toulouse, France
