DocumentCode
516456
Title
High Reliability Bipolar Integrated Circuits for 565Mbit/s Optical Transmission Systems
Author
Flavin, P.G. ; Hawker, I. ; Scott, D.L. ; Whitt, Spencer ; Blau, G.
Author_Institution
British Telecom Research Laboratories, Martlesham Heath, IPSWICH IP5 7RE, England.
fYear
1985
fDate
16-18 Sept. 1985
Firstpage
337
Lastpage
345
Abstract
A number of ECL integrated circuit designs, based on high reliability uncommitted logic arrays, are being developed at BTRL to enable the upgrading of the UK trunk transmission network from 140Mbit/s to 565Mbit/s. The performance of two of the designs has been reported in this paper, and it has been shown that the components offer ample speed margin for a fully integrated system.
Keywords
Bipolar integrated circuits; CMOS technology; Integrated circuit reliability; Integrated circuit technology; Integrated optics; Isolation technology; Low voltage; MOSFETs; Power dissipation; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1985. ESSCIRC '85. 11th European
Conference_Location
Toulouse, France
Type
conf
Filename
5468150
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