• DocumentCode
    516591
  • Title

    An Unified Built in Self-Test Scheme : UBIST

  • Author

    Nicolaidis, M.

  • Author_Institution
    TIM3/IMAG - 46 Av. Félix Viallet 38031 Grenoble Cédex - France
  • fYear
    1986
  • fDate
    16-18 Sept. 1986
  • Firstpage
    173
  • Lastpage
    175
  • Abstract
    Self-checking circuits are used to ensure concurrent error detection for on-line test of integrated circuits. In this paper we introduce an unified built in self-test scheme allowing to ensure all tests needed for integrated circuits : off-line test after manufacturing and on-line concurrent detection.
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Integrated circuit manufacture; Integrated circuit testing; Programmable logic arrays; Pulp manufacturing; Signal generators; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1986. ESSCIRC '86. Twelfth European
  • Conference_Location
    Delft, The Netherlands
  • Type

    conf

  • Filename
    5468388
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516591