DocumentCode :
516637
Title :
A Mixed-Mode A/D Converter with Self-Testing Capability
Author :
Leme, C.A. ; Franca, J.E. ; Maloberti, F. ; Piedade, M.S.
Author_Institution :
Centro de Electrónica Aplicada da Universidade Técnica de Lisboa, Departamento de Engenharia Electrotecnica e de Computadores, Lisboa Portugal
fYear :
1988
fDate :
21-23 Sept. 1988
Firstpage :
37
Lastpage :
41
Abstract :
This paper describes a 15-bit resolution self-calibrated A/D conversion system which can also realise the complementary D/A conversion. This makes it possible to implement a closed loop D/A + A/D conversion which can be used for performing a self-testing of the converter.
Keywords :
Analog-digital conversion; Approximation algorithms; Built-in self-test; Calibration; Capacitance; Capacitors; Linearity; Phase measurement; Sampling methods; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 1988. ESSCIRC '88. Fourteenth European
Conference_Location :
Manchester, UK
Type :
conf
Filename :
5468460
Link To Document :
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