Title :
A 100 ns 4Mbit (512KÃ\x978bit) CMOS EPROM
Author :
Kamaya, M. ; Higuchi, M. ; Urai, T. ; Ninomiya, K. ; Watanabe, T. ; Koyama, S. ; Jinbo, T.
Author_Institution :
LSI Memory Division, NEC Corporation, Kawasaki, Japan
Abstract :
This paper describes a high speed 4M bit CMOS EPROM with 100 ns access time, 512K à 8 bit organization, and 40 ¿s/word programing time. Polycide word lines, optimization of sense amplifier gain and anti-noise output buffer design are essential to shorten the access time. The chip is fabricated in 1.0 ¿m Nwell CMOS technology with double poly, single silicide, and single metal. To obtain pattern shrinkage, plugged contact structure is used. The chip size of 5.48 mm à 14.79 mm is accomplished.
Keywords :
Breakdown voltage; CMOS technology; Circuit noise; Design optimization; EPROM; Feedback circuits; Integrated circuit interconnections; Large scale integration; Lithography; Space technology;
Conference_Titel :
Solid-State Circuits Conference, 1988. ESSCIRC '88. Fourteenth European
Conference_Location :
Manchester, UK