Title :
A Totally Self-Checking CMOS ALU
Author :
Jückler, M. ; de Mahieu, S. ; Perotto, J.F. ; Trullemans, C.
Author_Institution :
Lab. de Microelectron., Univ. Catholique De Louvain, Louvain La Neuve, Belgium
Abstract :
A totally self-checking ALU is presented in this paper. Design starts from a structure described in Mead and Conway [1], self-checking property is obtained with the aid of a specially-developed, topology-oriented, logical simulator.
Keywords :
CMOS logic circuits; logic design; logical simulator; self-checking CMOS ALU; topology-oriented; Built-in self-test; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Decoding; Electrical fault detection; Fault detection; Multiplexing;
Conference_Titel :
Solid-State Circuits Conference, 1982. ESSCIRC '82. Eighth European
Conference_Location :
Brussels
