DocumentCode :
516916
Title :
Calculation and Measurement of the Sense Signal of Dynamic MOS RAMs
Author :
Hofmann, R. ; Lindner, R. ; Wolfgang, E.
Author_Institution :
Siemens AG, Munich, Germany
fYear :
1979
fDate :
18-21 Sept. 1979
Firstpage :
107
Lastpage :
109
Keywords :
Capacitance; Charge transfer; Electron beams; MOS capacitors; Mechanical variables measurement; Probes; Sampling methods; Signal design; Time measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8
Type :
conf
Filename :
5468930
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=516916
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