Title :
One-Device Cells for Dynamic Random-Access Memories
Author_Institution :
IBM Thomas J. Watson Research Center, Yorktown Heights, New York 10598
Keywords :
Capacitance; Capacitors; DRAM chips; Dielectrics and electrical insulation; FET integrated circuits; Image storage; Integrated circuit layout; MOSFET circuits; Random access memory; Read-write memory;
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8