• DocumentCode
    516931
  • Title

    Built-In Test for Complex Digital Integrated Circuits

  • Author

    Könemann, B. ; Mucha, J. ; Zwiehoff, G.

  • Author_Institution
    Technical University Aachen, Federal Republic of Germany
  • fYear
    1979
  • fDate
    18-21 Sept. 1979
  • Firstpage
    89
  • Lastpage
    90
  • Abstract
    A method for testing the logic function of complex digital integrated circuits is presented. The method is based on built-in test. The extra hardware needed is kept minimal by functional conversion of already existing components (e.g. latches). The feasibility of the proposed method is demonstrated by results from both hardware and logic simulation.
  • Keywords
    Built-in self-test; Circuit faults; Circuit testing; Digital integrated circuits; Hardware; Integrated circuit testing; Latches; Logic circuits; Logic testing; Registers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference - ESSCIRC 79, Fifth European
  • Conference_Location
    Southampton, UK
  • Print_ISBN
    0-85296-208-8
  • Type

    conf

  • Filename
    5468945
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516931