Title :
Cost Effective Semiconductor Memory Testing
Author :
Stevens, R.W. ; Brailsford, J.R.
Author_Institution :
International Computers Limited, Manchester
Keywords :
Circuit testing; Computer industry; Costs; Crosstalk; Failure analysis; Large scale integration; Magnetic cores; Random access memory; Semiconductor device testing; Semiconductor memory;
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8
