• DocumentCode
    516933
  • Title

    The Effect of Alpha-Particle-Induced Soft Errors on Memory Systems with Error Correction

  • Author

    Noorlag, D.J.W. ; Terman, L.M. ; Konheim, A.G.

  • Author_Institution
    Delft University of Technology, Delft, The Netherlands
  • fYear
    1979
  • fDate
    18-21 Sept. 1979
  • Firstpage
    86
  • Lastpage
    88
  • Abstract
    Using Poisson statistics, a model for the survival probability of a memory system having both hard and soft error bit failure mechanisms is developed. Calculations are made over a range of soft error generation rates and erasure intervals for both single and double error correction.
  • Keywords
    Alpha particles; Atomic measurements; Error analysis; Error correction; Helium; MOSFET circuits; Neutrons; Probability; Production; Radioactive decay;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference - ESSCIRC 79, Fifth European
  • Conference_Location
    Southampton, UK
  • Print_ISBN
    0-85296-208-8
  • Type

    conf

  • Filename
    5468947
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=516933