Title :
Design Aspects and Reliability of a Synchronizer Made in MOS Technology
Author :
Veendrick, H.J.M.
Author_Institution :
Philips Research Laboratories, Eindhoven - The Netherlands
Keywords :
Asynchronous communication; Capacitance; Clocks; Driver circuits; Flip-flops; Laboratories; Metastasis; Microprocessors; Synchronization; Threshold voltage;
Conference_Titel :
Solid State Circuits Conference - ESSCIRC 79, Fifth European
Conference_Location :
Southampton, UK
Print_ISBN :
0-85296-208-8
