Title :
A Single Chip Digital Voltmeter in P-MOS Technology
Author :
Kessler, H. ; Jiru, P.
Author_Institution :
Integrated Circuits Div., SIEMENS AG, Munich, Germany
Abstract :
The Dual Slope Conversion Technique is presently the most popular method employed in Digital Voltmeters. But needing high performance operational amplifiers for integrator and comparator, a one chip realization of this conversion method in MOS Technology implies a lot of external circuitry for the purpose of offset compensation and amplifier stability. Therefore a Single Slope Technique is used by discharging an external capacitor from the unknown voltage via a Constant-Current-Source and using the linear voltage-time relationship for conversion. All offset and adjusting problems of this method can be solved digitally.
Keywords :
MOSFET; operational amplifiers; voltmeters; P MOS technology; constant current source; dual slope conversion technique; high performance operational amplifiers; one chip realization; single chip digital voltmeter; single slope technique; Charge measurement; Circuits; Current measurement; Electrical resistance measurement; Electronics packaging; MOS capacitors; Semiconductor device measurement; Tellurium; Voltage; Voltmeters;
Conference_Titel :
Solid State Circuits Conference - Digest of Technical Papers, 1978. ESSCIRC 78. 4th European
Conference_Location :
Amsterdam
