• DocumentCode
    517038
  • Title

    Laser Testing of Integrated Circuits

  • Author

    Smith, J.G. ; Oldham, H.E.

  • Author_Institution
    Dept. of Electron., Univ. of Southampton, Southampton, UK
  • fYear
    1976
  • fDate
    21-24 Sept. 1976
  • Firstpage
    86
  • Lastpage
    87
  • Abstract
    A laser beam is used to inject data at MHz rates into internal circuit nodes of an integrated circuit, reducing the time required for device testing and fault location.
  • Keywords
    fault location; integrated circuit testing; laser beam applications; MHz rates; University; device testing; fault location; inject data; integrated circuits; internal circuit nodes; laser testing; Circuit faults; Circuit testing; Fault diagnosis; Integrated circuit testing; Laser beams; Laser feedback; Laser theory; Lasers and electrooptics; Power lasers; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference, 1976. ESSCIRC 76. 2nd European
  • Conference_Location
    Toulouse
  • Type

    conf

  • Filename
    5469081
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=517038