• DocumentCode
    517150
  • Title

    Smart Temperature Sensor with Integrated Bitstream Calibration

  • Author

    van der Horn, Gert ; Huijsing, Johan H.

  • Author_Institution
    Electronic Instrumentation Laboratory / DIMES, Technical University Delft, Mekelweg 4, 2628 CD Delft, The Netherlands. Phone +31.15.786518, Fax +31.15.785755
  • fYear
    1995
  • fDate
    19-21 Sept. 1995
  • Firstpage
    234
  • Lastpage
    237
  • Abstract
    A novel sensor calibration technique has been applied for temperature measurements with an inaccuracy of 0.1% of the full scale. A PTAT and bandgap reference circuit and a sigma-delta AD converter have been integrated on the same chip together with digital calibration circuitry. The digital output can be calibrated for offset, gain, and 2nd-order non-linearity errors for an arbitrary temperature range in between ¿40°C and 125°C.
  • Keywords
    Bipolar transistors; Calibration; Circuits; Delta-sigma modulation; Multiplexing; Photonic band gap; Signal generators; Temperature dependence; Temperature sensors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
  • Conference_Location
    Lille, France
  • Print_ISBN
    2-86332-180-3
  • Type

    conf

  • Filename
    5469283
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=517150