• DocumentCode
    517213
  • Title

    Implementation Constraints in Self-Checking Integrated Circuits

  • Author

    Crouzet, Y. ; Landrault, C.

  • Author_Institution
    Laboratoire d´´Automatique et d´´Analyse des Systÿmes du Centre National de la Recherche Scientifique, Toulouse, France
  • fYear
    1979
  • fDate
    18-21 Sept. 1979
  • Firstpage
    58
  • Lastpage
    60
  • Abstract
    Summing up, we can say that the failures can be divided into three classes according to whether they induce single, unidirectional or multiple errors. Each of these three classes can also be divided into two groups : permanent and transient errors. The table of figure 2 gives for each class the main failures encountered.
  • Keywords
    Circuit faults; Computer aided manufacturing; Computer integrated manufacturing; Degradation; Fault tolerance; Fault tolerant systems; Integrated circuit manufacture; Pulp manufacturing; Threshold voltage; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Circuits Conference - ESSCIRC 79, Fifth European
  • Conference_Location
    Southampton, UK
  • Print_ISBN
    0-85296-208-8
  • Type

    conf

  • Filename
    5469348
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=517213