DocumentCode
517228
Title
High Reliability Circuits for Space Applications
Author
Grégoris, G.
Author_Institution
Alcatel Espace, 26 avenue JF Champollion, BP 1187, F-31037 Toulouse. Tel: (33) 61 19 56 56, Fax: (33) 61 19 52 11
fYear
1995
fDate
19-21 Sept. 1995
Firstpage
20
Lastpage
23
Abstract
The aim of this contribution is to present and discuss a methodology for the Development/Design and the Reliability/Quality Assurance of advanced Application Specific Integrated Circuits for digital, analog and microwave space applications. Starting from the technical and managerial requirements of space projects, the presentation shows today´s procedure to fly advanced microelectronics. Areas of potential improvements or revisions are identified to reach an approach that would be more compatible with the fast technological and industrial evolutions in Space industry. Various activities of the Design/Developpement and Quality/Reliability Assurance are addressed and illustrated. Study cases are presented on reliability prediction, failure mode effects analyses, definition of safe operating conditions, process evaluation and parts selection. The presentation draws some conclusions about the technical and managerial trends.
Keywords
Aerospace industry; Application specific integrated circuits; Failure analysis; Integrated circuit reliability; Integrated circuit technology; Microelectronics; Microwave theory and techniques; Project management; Quality assurance; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
Conference_Location
Lille, France
Print_ISBN
2-86332-180-3
Type
conf
Filename
5469363
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