DocumentCode
517254
Title
Design and Verification Strategies for Ensuring Long-Term Reliability of a 300-MHz Microprocessor
Author
Preston, Ronald P. ; Bowhill, William J. ; Gronowski, Paul E. ; Mehta, Shekhar ; Fischer, Timothy C. ; Cvijetic, Radenko ; Lameré, Mare E. ; Badeau, Roy
Author_Institution
Digital Equipment Corporation, 77 Reed Rd., Hudson, MA 01749, USA
fYear
1995
fDate
19-21 Sept. 1995
Firstpage
278
Lastpage
281
Abstract
A number of factors such as hot carrier degradation and electromigration affect the long-term reliability of high performance microprocessors. The complexity and high clock rates of modern chips require sophisticated verification strategies to ensure that the design meets all reliability requirements. Design methodologies employed on the 300 Mhz Alpha 21164 microprocessor to ensure long-term reliability are examined.
Keywords
Clocks; Coupling circuits; Degradation; Design methodology; Driver circuits; Electromigration; Hot carriers; Integrated circuit interconnections; Microprocessors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 1995. ESSCIRC '95. Twenty-first European
Conference_Location
Lille, France
Print_ISBN
2-86332-180-3
Type
conf
Filename
5469390
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